A development of burn-in self test capability for Intel Flash Memory devices.

Lim, Felix C. (1994) A development of burn-in self test capability for Intel Flash Memory devices. Masters thesis, De La Salle University - Dasmariñas.

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Abstract

ABSTRACT see Upload (MT ENGRNG 3 1994)

Item Type: Thesis (Masters)
Additional Information: MT ENGRNG 3 1994
Subjects: T Technology > T Technology (General)
Users: College of Engineering, Architecture and Technology > Technology
Depositing User: Ivyjoy Viray
Date Deposited: 28 Jun 2016 04:38
Last Modified: 28 Jun 2016 04:38
URI: http://thesis.dlsud.edu.ph/id/eprint/3868

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